variable pressure scanning electron microscope Search Results


6480 variable-pressure scanning electron microscope  (JEOL)
90
JEOL 6480 variable-pressure scanning electron microscope
6480 Variable Pressure Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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6480 variable-pressure scanning electron microscope - by Bioz Stars, 2026-03
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s-3000n variable pressure scanning electron microscope  (Hitachi Ltd)
90
Hitachi Ltd s-3000n variable pressure scanning electron microscope
S 3000n Variable Pressure Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/s-3000n variable pressure scanning electron microscope/product/Hitachi Ltd
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s-3000n variable pressure scanning electron microscope - by Bioz Stars, 2026-03
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variable-pressure scanning electron microscope s-3400n  (Hitachi Ltd)
90
Hitachi Ltd variable-pressure scanning electron microscope s-3400n
Variable Pressure Scanning Electron Microscope S 3400n, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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variable pressure scanning electron microscope (vp-sem  (Hitachi Ltd)
90
Hitachi Ltd variable pressure scanning electron microscope (vp-sem
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem/product/Hitachi Ltd
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope - by Bioz Stars, 2026-03
90/100 stars
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sigmatm variable pressure scanning electron microscope (sem)  (Carl Zeiss)
90
Carl Zeiss sigmatm variable pressure scanning electron microscope (sem)
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Sigmatm Variable Pressure Scanning Electron Microscope (Sem), supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/sigmatm variable pressure scanning electron microscope (sem)/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
sigmatm variable pressure scanning electron microscope (sem) - by Bioz Stars, 2026-03
90/100 stars
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evo lf-15 variable pressure scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss evo lf-15 variable pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Evo Lf 15 Variable Pressure Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/evo lf-15 variable pressure scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
evo lf-15 variable pressure scanning electron microscope - by Bioz Stars, 2026-03
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ma10 variable pressure scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss ma10 variable pressure scanning electron microscope
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Ma10 Variable Pressure Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/ma10 variable pressure scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
ma10 variable pressure scanning electron microscope - by Bioz Stars, 2026-03
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variable pressure scanning electron microscope leo 435 vp  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope leo 435 vp
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope Leo 435 Vp, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope leo 435 vp/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope leo 435 vp - by Bioz Stars, 2026-03
90/100 stars
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variable pressure scanning electron microscope (vp-sem) ep evo 50  (Carl Zeiss)
90
Carl Zeiss variable pressure scanning electron microscope (vp-sem) ep evo 50
<t>Scanning</t> electron microscopy <t>(SEM)</t> and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).
Variable Pressure Scanning Electron Microscope (Vp Sem) Ep Evo 50, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure scanning electron microscope (vp-sem) ep evo 50/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure scanning electron microscope (vp-sem) ep evo 50 - by Bioz Stars, 2026-03
90/100 stars
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variable pressure field emission scanning electron microscope supra-55vp  (Carl Zeiss)
90
Carl Zeiss variable pressure field emission scanning electron microscope supra-55vp
Scanning electron <t>microscope</t> image of S. pneumoniae biofilms formed in 24-well tissue culture plate. (a) Biofilm formed in YE medium supplied with 0.2 % hyaluronic acid. (b) Biofilm formed in YE medium supplied with 0.2% glucose. (c) Biofilms formed in YE medium only.
Variable Pressure Field Emission Scanning Electron Microscope Supra 55vp, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/variable pressure field emission scanning electron microscope supra-55vp/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
variable pressure field emission scanning electron microscope supra-55vp - by Bioz Stars, 2026-03
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supra variable pressure field emission scanning electron microscope  (Carl Zeiss)
90
Carl Zeiss supra variable pressure field emission scanning electron microscope
Scanning electron <t>microscope</t> image of S. pneumoniae biofilms formed in 24-well tissue culture plate. (a) Biofilm formed in YE medium supplied with 0.2 % hyaluronic acid. (b) Biofilm formed in YE medium supplied with 0.2% glucose. (c) Biofilms formed in YE medium only.
Supra Variable Pressure Field Emission Scanning Electron Microscope, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/supra variable pressure field emission scanning electron microscope/product/Carl Zeiss
Average 90 stars, based on 1 article reviews
supra variable pressure field emission scanning electron microscope - by Bioz Stars, 2026-03
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Image Search Results


Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Journal: Plants

Article Title: Antioxidant Responses of Phenolic Compounds and Immobilization of Copper in Imperata cylindrica , a Plant with Potential Use for Bioremediation of Cu Contaminated Environments

doi: 10.3390/plants9101397

Figure Lengend Snippet: Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) analysis of Imperata cylindrica after 21 days of growth. ( A ) Transverse cutting of shoot under control condition, and ( B ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( E ) Transverse cutting of root (rhizome) under control condition, and ( F ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate). Elemental localization by EDX analysis: ( C ) Transverse cutting of shoot under control condition, and ( D ) Transverse cutting of shoot under stress condition (300 mg Cu kg −1 substrate). ( G ) Transverse cutting of root (rhizome) under control condition, and ( H ) Transverse cutting of root (rhizome) under stress condition (300 mg Cu kg −1 substrate).

Article Snippet: In order to localize the Cu-bound to the shoot and root tissues, plants with 21 days of growth were observed by Variable Pressure Scanning Electron Microscope (VP-SEM), with transmission module STEM SU-3500 (Hitachi, Tokyo, Japan).

Techniques: Electron Microscopy

Scanning electron microscope image of S. pneumoniae biofilms formed in 24-well tissue culture plate. (a) Biofilm formed in YE medium supplied with 0.2 % hyaluronic acid. (b) Biofilm formed in YE medium supplied with 0.2% glucose. (c) Biofilms formed in YE medium only.

Journal: BioMed Research International

Article Title: Hyaluronic Acid Derived from Other Streptococci Supports Streptococcus pneumoniae In Vitro Biofilm Formation

doi: 10.1155/2013/690217

Figure Lengend Snippet: Scanning electron microscope image of S. pneumoniae biofilms formed in 24-well tissue culture plate. (a) Biofilm formed in YE medium supplied with 0.2 % hyaluronic acid. (b) Biofilm formed in YE medium supplied with 0.2% glucose. (c) Biofilms formed in YE medium only.

Article Snippet: The SEM analysis was performed using a variable pressure field emission scanning electron microscope (VP-FE-SEM, SUPRA-55VP, Carl Zeiss, Germany).

Techniques: Microscopy